Ingeniería Electrónica

Permanent URI for this community

Now showing 1 - 1 of 1

Analysis of the impact of artificial networks in system-level EMC tests
(2022) Gardella, Pablo J.; Mariani, Eduardo
The impedance of an Off-The-Shelf Artificial Network (OTS-AN) and a custom made High-Frequency Artificial Network (HF-AN) were analysed and compared. It is showed that in order to meet the requirements of automotive standards, such as Bulk Current Injection (BCI) from ISO 11452-4 as well as both Conducted and Radiated Emissions (CE, RE) from CISPR 25, the HF-AN is needed. System-level circuit simulations were run using S-parameters for quantifying the impact of these two models in the previously mentioned EMC tests. Above 50 MHz, up to 3.5 dB and 4.3 dB differences were found on the transferimpedance of CE and in the Common-Mode to Differential-Mode conversion of BCI, respectively. On the other hand, in RE the OTS-AN leaded to an overestimation of the emission profile in the 300 MHz and 800 MHz band as high as 5.3 dB. Besides that, it is showed that the OTS-AN behaves as a source of non-constant uncertainty, specially above 50 MHz. Finally, the issues in terms of reproducibility, repeatability and accuracy that arise from the non-RF connectors in the OTS-AN are discussed and a metric for test-bench comparison and validation is proposed.