Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration

Ledesma, Francisco Daniel; Dutriez Diaz, Philippe; Scapolla, Franco; Lin, Xi; Gardella, Pablo

Ponencia en Congreso:
Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration

dc.contributor.author	Ledesma, Francisco Daniel
dc.contributor.author	Dutriez Diaz, Philippe
dc.contributor.author	Scapolla, Franco
dc.contributor.author	Lin, Xi
dc.contributor.author	Gardella, Pablo
dc.date.accessioned	2022-11-11T17:04:18Z
dc.date.available	2022-11-11T17:04:18Z
dc.date.issued	2022
dc.description.abstract	"Technology developments are demanding increasingly stringent requirements in terms of Electromagnetic Com patibility (EMC). For IC designers, this implies increasing Power Supply Rejection (PSR) while at the same time reducing the Icc spectrum. This work provides a theoretical analysis of the Peak Current Source with emitter degeneration (PCS-ED), a well known current mirror to achieve high PSR, which gets improved even further by the emitter resistance. The trade-off between the output current and the PSR were analyzed, as well as a sensitivity analysis to quantify the effects of the emitter degeneration. Experimental measurements have been performed to validate the immunity of an off-the-shelf bipolar transistor array from 100kHz up to 1GHz. Results showed that despite the small-signal analyses predicted a considerable improvement, the non-linear effects introduced by the input stage remained as the limiting factor in terms of PSR, leading to similar responses in the Peak Current Source (PCS) and the PCS-ED, despite one having much larger PSR than the other."
dc.identifier.uri	https://ri.itba.edu.ar/handle/123456789/3991
dc.language.iso	en	en
dc.relation	info:eu-repo/semantics/altIdentifier/doi/10.1109/CAE54497.2022.9762507
dc.subject	COMPATIBILIDAD ELECTROMAGNETICA	es
dc.subject	CORRIENTES ELECTRICAS	es
dc.title	Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration	en
dc.type	Ponencias en Congresos	es
dc.type	info:eu-repo/semantics/acceptedVersion
dspace.entity.type	Ponencia en Congreso
itba.description.filiation	Fil: Ledesma, Francisco Daniel. Instituto Tecnológico de Buenos Aires; Argentina.
itba.description.filiation	Fil: Dutriez Diaz, Philippe. Instituto Tecnológico de Buenos Aires; Argentina.
itba.description.filiation	Fil: Scapolla, Franco. Instituto Tecnológico de Buenos Aires; Argentina.
itba.description.filiation	Fil: Lin, Xi. Instituto Tecnológico de Buenos Aires; Argentina.
itba.description.filiation	Fil: Gardella, Pablo. Instituto Tecnológico de Buenos; Argentina.
itba.description.filiation	Fil: Gardella, Pablo. Allegro Microsystems Argentina S. A.; Argentina