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Design of ESD protections for ECG applications

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Date

2020-02

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Abstract

"This paper presents the design of Electrostatic Discharge (ESD) protections for a remote Electroencephalograph (ECG). Design and layout guidelines are analyzed to improve the ESD robustness of a Grounded-Gate NMOS (GGNMOS) cell based on a single well CMOS-only process. Experimental validation is done by means of a Time Domain Reflectometry (TDR) technique known as Transmission Line Pulse (TLP) testing. The silicon implementation of the proposed design passes ±3700V in the Human-Body Model (HBM)."

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ELECTROENCEFALOGRAFIA, CIRCUITOS INTEGRADOS

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